VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Cham: Springer International Publishing, Imprint: Springer, 2016
Online
Sammelwerk, Elektronische Ressource
- 1 Online-Ressource (XIII, 223 p. 121 illus)
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Titel: |
VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
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Verantwortlichkeitsangabe: | edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis |
Autor/in / Beteiligte Person: | Shin, Youngsoo ; Tsui, Chi Ying ; Kim, Jae-Joon ; Choi, Kiyoung ; Reis, Ricardo |
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Veröffentlichung: | Cham: Springer International Publishing, Imprint: Springer, 2016 |
Medientyp: | Sammelwerk |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 Online-Ressource (XIII, 223 p. 121 illus) |
ISBN: | 9783319460970 |
DOI: | 10.1007/978-3-319-46097-0 |
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