Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization
Cham: Springer International Publishing, Imprint: Springer, 2018
Online
Sammelwerk, Elektronische Ressource
- 1 Online-Ressource (XX, 594 p. 336 illus., 266 illus. in color)
Ermittle Ausleihstatus...
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Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization
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Verantwortlichkeitsangabe: | edited by Hiroyuki Fujiwara, Robert W. Collins |
Autor/in / Beteiligte Person: | Fujiwara, Hiroyuki ; Collins, Robert W. |
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Veröffentlichung: | Cham: Springer International Publishing, Imprint: Springer, 2018 |
Medientyp: | Sammelwerk |
Datenträgertyp: | Elektronische Ressource |
Umfang: | 1 Online-Ressource (XX, 594 p. 336 illus., 266 illus. in color) |
ISBN: | 9783319753775 |
DOI: | 10.1007/978-3-319-75377-5 |
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